Sze Yun Set, The University of Tokyo, Japan
Ju-Han Lee, University of Seoul, South Korea
Dinggang Peng, The University of New South Wales, Australia
Andrey Komarov, Institute of Automation and Electrometry, Russian
Chang Wonkeun, Nanyang Technological University, Singapore
Deepak Jain, IIT Bombay, India
Jianxiang Wen, Shanghai University, China
Jianzhong Zhang, Harbin Engineering University, China
Jing He, Cambridge University, UK
Masaki Tokurakawa, University of Electro-Communication, Japan
Morten Ibsen, University of Southampton, UK
Ori Henderson-Sapir, Adelaide University, Australia
Ryszard Buczyński, University of Warsaw, Poland
Seong Woo Yoo, Nanyang Technological University, Singapore
Shahraam Afshar, University of South Australia, Australia
Ortwin Hess, Trinity College Dublin, UK
Kartik Srinivasan (Fed), National Institute of Standards and Technology, USA
Lin Wu, Singapore University of Technology and Design, Singapore
Ali Elshaari, KTH Royal Institute of Technology Stockholm, Sweden
Bumki Min, Korea Advanced Institute of Science and Technology, South Korea
Yidong Chong, Nanyang Technological University, Singapore
Christian A. Nijhuis, University of Twente, Netherlands
Fang Bo, Nankai University, China
Francisco J. Garcia-Vidal, Universidad Autonoma de Madrid, Spain
Guixin Li, Sourth University of Science & Technology, China
Harald Schwefel, University of Otago, New Zealand
Jin Liu, Sun Yat-Sen University, China
Jonathan Mar, Newcastle University, UK
Mengjie Yu, University of Southern California, USA
Paul Barclay, University of Calgary, Canada
Päivi Törmä, Aalto University, Finland
Satoshi Iwamoto, University of Tokyo, Japan
Takasumi Tanabe, Keio University, Japan
Thiago Alegre, Unicamp, Brazil
Xiao Xiong, Institute of High Performance Computing, A*STAR, Singapore
Xifeng Ren, University of Science and Technology of China, China